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Secondary ions produced by 400 eV He+ ion impact on Ar, Kr, and Xe thin films deposited on a silicon substrate at 8 K were measured as a function of film thickness using a time-of-flight secondary-ion mass spectrometer. For Ar, the cluster ions Ar-n(+) up to n = 4 as well as...
作者: 刘琳 摘要: 本文对本田雅阁汽车空调系统的构成进行了简单介绍,并结合空调制冷系统,电磁离合器以及鼓风机调速故障的诊断与检修进行探讨,分析了具体流程,以供参考. 关键词: 广本雅阁;空调系统;故障;诊断;检修 DOI: 10.3969/j.issn.1674-957X.2019.02.056 年份: 2019 收藏...
Secondary ions produced by 400eV He+ ion impact on Ar, Kr, and Xe thin films deposited on a silicon substrate at 8K were measured as a function of film thickness using a time-of-flight secondary-ion mass spectrometer. For Ar, the cluster ions Arn+ up to n=4 as well as the monomer...
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project requiring an investment of $1,200 is expected to generate returns of $400 in years 1 and 2 and $350 in years 3 and 4. If the NPV = $22 at 9% and the NPV the project? =-$4 at 10%, what is the IRR for project?
Secondary ions produced by 400 eV He+ ion impact on Ar, Kr, and Xe thin films deposited on a silicon substrate at 8 K were measured as a function of film thickness using a time-of-flight secondary-ion mass spectrometer. For Ar, the cluster ions Ar-n(+) up to n = 4 as well as...