planarized 3D, control 2D/3D, and planarized 2D/3D p-i-n PSCs with a bandgap of 1.57 eV. b) J–V curves of the champion planarized 2D/3D p-i-n PSCs with a bandgap of 1.55 eV.
planarized 3D, control 2D/3D, and planarized 2D/3D p-i-n PSCs with a bandgap of 1.57 eV. b) J–V curves of the champion planarized 2D/3D p-i-n PSCs with a bandgap of 1.55 eV.
SEM images were obtained by using a field emission scanning electron microscope microscope (SU8220, Hitachi, Japan). Grazing-incidence wide-angle X-ray scattering (GIWAXS) characterization GIWAXS patterns were obtained by using a Xenocs Xeuss SAXS/WAXS beamline system based on an X-ray wavelength ...
A GIXGUI Matlab toolbox was utilized for necessary corrections of GIWAXS raw patterns.50 Device Characterization Device tests were performed in an N2-filled glovebox. J-V curves were measured using a Keithley 2400 source unit under simulated AM1.5G solar illumination at 100 mW/cm2 (1 sun)....
In the present study, Grazing-Incidence Wide-Angle X-ray Scattering (GIWAXS) was applied to investigate a diffraction pattern of CotY 2D crystals formed on Langmuir monolayer films. We observed two distinct diffraction rings and their position corresponds to a structure with the lattice spacing of...
Fig. 5: GIWAXS patterns for drop-cast PEA-2D and iso-BA-2D perovskite films. aNaturally dried PEA-2D film;bN2blow-dried PEA-2D film;cN2blow-dried PEA-2D film with MACl additive;dnaturally dried iso-BA-2D film;eN2blow-dried iso-BA-2D film;fN2blow-dried iso-BA-2D film with MACl...
我们猜测,处于层间的阳离子通过其末端的铵基氮与无机铅碘骨架相互作用,而阳离子堆叠方式不同会导致明显的位阻变化,从而影响无机骨架的晶格间距,最终改变了薄膜的残余应力。晶格常数的变化由XRD峰的位移以及GIWAXS对面外方向积分曲线峰位的位移证明。 ...
(SAED) pattern, and those ind,fare the corresponding FFT patterns.g,hPhotographs of fresh Ti3C2TxMXene in water, and the aged Ti3C2TxMXene dispersion in water after 30 days in open air, showing an opaque whitish color due to oxidation.iUV–visible absorbance spectra of pristine Ti3C2Txin...
b X-ray diffraction patterns and c Phi-scans of control and SCN-TP films. d Pole fig- ure and e cross-sectional SEM image of SCN-TP film. GIWAXS images of f control film and g SCN-TP film. Cross-sectional SEM image of h FPEA-TP film and i MA-TP film The (202) plane is ...
The GIWAXS sample stage was equipped with a 7-axis motorized stage for the fine alignment of sample, and the incidence angle of X-ray beam was set to be 0.13–0.135° for polymer films, ITIC film and their bend films. GIWAXS patterns were recorded with a 2D CCD detector (Rayonix SX...