Cross-sectional scanning electron microscope images of the device at different spots: (A) uniform regions and (B) nonuniform regions.Source: B. Lei, et al. (2009), Statistical characterization of the memory effect in polyfluorene based non-volatile resistive memory devices, Org. Electron. Phys...
shown in panelgalong with the color legend. The encircled Al/AlOx/Al tunnel junction is shown in higher magnification in panelh. The scale bars denote 2 mm (c), 5 mm (d), 20 μm (f), and 500 nm (h), respectively. See the Data availability section for raw images. ...
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Graphene is one of the carbon nanoallotrope that has the potential to replace traditional materials in nanoelectronics. The use of this 2D crystal is nanoelectronics is due to its typical properties that provides improved performance, extended functionality over Silicon era. In this paper, a review ...
A Mathematical Algorithm and Custom Nanoprobes to Improve the Resolution of Magnetic Force Microscopy (MFM) Images Gomez, Pablo;Fernandez, Robert;Amos, Nissim;Khizroev, Sakhrat;Lopez, Claudia M. 20-25 An Effective Switching-Off Mechanism for High-Performance Carbon Nanotube Field-Effect Transistors...
a–h Schematic illustrations and SEM or optical images of different nanodevices, including branched nanotube FET (a), gold-mushroom-shaped electrode (b), nanowire electrode (c), nanopillar electrode (d), nanotube electrode (e), volcano-shaped electrode (f), kinked nanowire FET (g), U-shaped...
TEM images confirm the presence and size of CdS nanoparticles. The surface temperature was estimated theoretically considering the relationships between the temperature, time and power of the laser pulses. Nanoparticle formation via laser probe is also discussed in terms of possible utilization of other...
silicon carbideSiC polytypes9R-SiChigh resolution transmission electron microscopyhigh resolution image simulationwhiskershttp://journals.cambridge.org/cover_images/MRS/MRS.jpgdoi:10.1557/mrs2001.133KaldorSteffen K.Cambridge University PressMrs Bulletin
Atomic force microscope (AFM) images are used to study these defects and determine their relative frequencies. The authors connect these defects to fault models and predict their likely impact on the behaviour of logic gates. Based on simulation program with integrated circuit emphasis simulation data...
However, closer to the ion track, evaporative sputtering can occur.AFM images of gas-deposited WO3 nanoparticle-films indicated the formation of agglomerates. The size distribution of the agglomerates was measured to be log-normal, i.e. similar to the size distribution of the...