A data analysis method for an integrated circuit process is described, for analyzing the results of at least an in-line quality test, a product test and a yield test done to the products of the IC process. The products are divided into a normal group and an abnormal group based on the ...
integrated circuit reliabilityintegrated circuitsquality control/ integrated circuit fault data analysisgeneralized linear modelssilicon wafersdefect spatial distributionFault data for integrated circuits manufactured on silicon wafers are usually presented using wafer maps to indicate the spatial distribution of ...
integrated circuit packagingproduction controlregression analysistransfer moulding/ fuzzy linear regression approachtransfer mouldingmicrochip encapsulation... KW Ip,CK Kwong,YW Wong - 《Journal of Materials Processing Technology》 被引量: 28发表: 2003年 Asymptotic Properties of a Class of Mixture Models fo...
PURPOSE:To select a logical output in a resetting period optionally by connecting an additional circuit which has high output impedance during the resetting period to the output side of the output port register of a logical output impedance IC. CONSTITUTION:When a reset pulse RS is supplied to ...
Very large-scale integrated circuit (VLSI) arithmetic units are essential for the operations of the data paths and/or the addressing units of microprocessors, digital signal processors (DSPs), as well as data-processing application-specific integrated circuits (ASICs) and programmable integrated circuit...
Integrated Circuit: Definition What's inside a microprocessor? We know that a microprocessor is a digital circuit, mainly built using a combination of logic functions, but how are these functions built? What's really inside the plastic package that includes the microprocessor? In fact, the ...
The delay analysis for such a circuit involves solving distributed RC networks, a problem we already encountered when analyzing the delay of interconnect networks. Consider the pull-down delay of the circuit. The output is dis- charged when all inputs are driven high. The proper initial ...
• Logic effort • CMOS power analysis Digital IC 3 Static CMOS Circuit • At every point in time (except during the switching transients) each gate output is connected to either VDD or VSS via a low-resistive path • The outputs of the gates assume at all times the...
System and method for testing integrated circuits by transient signal analysis A system and method for testing an integrated circuit (IC) by transient signal analysis includes a comparison circuit that is configured to generate a comparison signal from an IC transient signal and a reference signal. ...
Two-dimensional transition metal dichalcogenides could potentially be used to create transistors that are scaled beyond the capabilities of silicon devices. However, despite progress on the single-transistor level, the development of high-frequency integ