PURPOSE: To provide a holding system for a chip for burn-in test by which a large number of KGD are obtained at one test process by excluding the operating limit of a tape carrier by the TAB method and the complication of the design of a test housing by the packaging method, and to ...
【1】focus on【2】burn down【3】make the most of【4】have trouble understanding【5】now and then【6】Thanks to【7】stay in touch with【8】regarded as【9】concentrating on【10】at one with
外部播放此歌曲> Burn In Noise - Truffle Shuffle 专辑:Psy-Fi Book of Changes (Compiled by Astrix) 歌手:Burn In Noise 还没有歌词哦
BURN-IN BOARD OF SEMICONDUCTOR INSPECTION DEVICE 来自 百度文库 喜欢 0 阅读量: 17 申请(专利)号: JP特願平6-77306 申请日期: 19940415 公开/公告号: JP特開平7-287047A 公开/公告日期: 19951031 申请(专利权)人: MITSUBISHI ELECTRIC CORP 三菱電機株式会社 发明人:...