VLSI Test Symposium, 1994. Proceedings., 12th IEEE
* Microsystems/MEMS/Sensors Test * Memory Test and Repair * On-Line Test & Error Correction * Power/Thermal Issues in Test * System-on-Chip (SOC) Test * Test Standards & Economics * Test of Biomedical Devices * Test of High-Speed I/O * Test Quality and Reliability * Test Resource Part...
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems. Major topics include, but are not limited to: • Analog, Mixed-Signal & RF Test • ATPG & Compression • ATE Architecture & Software • B...
Proceedings, 22nd IEEE VLSI Test Symposium : 25-29 April 2004, Napa Valley, California This paper proposes new current signatures for testpurposes. It estimates their capabilities in the detectionof additional current caused by weak resistive... IVT Symposium - IEEE Computer Society 被引量: 0发表...
VTS (IEEE VLSI Test Symposium) 状态: 网络会议 官网链接: http://tttc-vts.org/public_html/new/2020/ 往届会议录: https://ieeexplore.ieee.org/xpl/conhome/1000804/all-proceedings ISPASS (Int’l Symposium on Performance Analysis of Systems and Software) ...
1992 ieee vlsi test symposium - improving the theory of truth table verification of iterative logic arrays Nicolaidis,M 被引量: 0发表: 1992年 [IEEE Digest of Papers. 1992 IEEE VLSI Test Symposium - Atlantic City, NJ, USA (7-9 April 1992)] Digest of Papers. 1992 IEEE VLSI Test ...
VTS (IEEE VLSI Test Symposium)状态: 网络会议官网链接: tttc-vts.org/public_htm往届会议录:ieeexplore.ieee.org/xpl ISPASS (Int’l Symposium on Performance Analysis of Systems and Software)状态: 推迟会议官网链接: ispass.org/ispass2020/往届会议录:ieeexplore.ieee.org/xpl SOSE (Int’l Symposium ...
IEEE VLSI Test Symposium 一级会议,在美国召开 测试领域 30 IEEE/ACM Design, Automation and Test in Europe 一级会议,在欧洲召开 设计和测试领域 31 IEEE Asian Test Symposium 一级会议,在亚洲召开 测试领域 32 Ubicomp: International Conference on Ubiquitous Computing ...
IEEE欧洲测试技术年会(The IEEE European Test Symposium)是欧洲集成电路和电路系统领域最重要的年度学术会议之一,重点展示和讨论集成电路和系统的测试、可靠性、安全性和验证领域的科学成果、前沿技术、研究热点和发展趋势。大会今年吸引了250余名来自世界各地的学者参加。
Rotem, "Relative Timing," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 1, no. 11, pp. 129-140, Feb. 2003... KS Stevens,R Ginosar,S Rotem - International Symposium on Advanced Research in Asynchronous Circuits & Systems 被引量: 149发表: 1999年 A Timing-Dependen...