First-principles elastic constants of alpha- and theta-Al2O3. SHANG S,WANG Y,LIU Z-K. Applied Physics . 2007SL Shang,Y Wang,ZK Liu.First-Principles Elastic Constants of Alpha- and Theta-Al2O3. Applied Physics Letters . 2007S.L. Shang, Y. Wang, Z.K. Liu, First-principles elastic...
Single-phase theta-Al2O3 nanopowder has been synthJournal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and PhysicsJbaraAlAhmedAlS.AlSaeedAlM.AlA.AlOthamanAlZulkafliAlJbara, A.S.; Othaman, Z.; Saeed, M.A. Structural, morphological and...
由PARXPS 数据得出的相对深度曲线,显示了多层膜材料中膜层排列顺序。 膜层结构顺序为 Al2O3、HfO2、SiO2 和 Si(衬底)。 图中可见这些薄膜层结构和污染碳层。 厚度测量 利用集成在 Avantage 数据系统中的覆盖层厚度计算软件,数值计算膜层厚度。 多层膜的厚度用 PARXPS 计算...
27Al MAS NMR has been used to study a sol–gel prepared alumina annealed at various temperatures. Two-field simulation of the sample heated to 1200 °C confirmed the presence of corundum, as suggested by XRD, and also the presence of nanocrystalline θ-Al 2O 3. 27Al MAS NMR chemical shi...
Omega/Theta XRD可测材料类型有Si、Ge、SiC、Al2O3(蓝宝石)、石英、AlN、GaAs、LiNbO3、BBO、高温涡轮叶片等 200多种半导体、光学、电子、高温合金等单晶晶体; 可对整块晶体取向mapping(弗莱贝格*)进行测量; 可测直径大可达590mm(可根据需求定制更大检测尺寸); 检测精度高达0.003° ,检测速度快——5s/试样; 可...
附件 2 :Al2O3-DANXIE.cif 2015-01-14 10:03:30, 1.93 K 心如花木，向阳而长。 我邮箱：...
Al 2 O 3 DTA/DIL α-Al 2 O 3 θ-α-Al 2 O 3 θ-d cθ α-d cα 1.5 10C/min θ-θ-50 nm α-Al 2 O 3 Dilatometric (DIL) measurements and differential thermal analysis (DTA) techniques were employed to investigate the dynamic characteristics during θ-to α-phase transformation...
膜层结构顺序为 Al2O3、HfO2、SiO2 和 Si(衬底)。 图中可见这些薄膜层结构和污染碳层。 厚度测量 利用集成在 Avantage 数据系统中的覆盖层厚度计算软件,数值计算膜层厚度。 多层膜的厚度用 PARXPS 计算。 比较Si 片上 SiO2 膜层的 ARXPS 和椭偏的测量。 虽然曲线线性很好且斜率接近于 1,但是在椭偏轴上有 ...
The degree of cracking increases initially as theta- transforms to alpha-Al2O3, then decreases as the cracks heal, and then increases again prior to spallation. Area stress maps, based on the bimodal luminescence and average fraction ... M Wen 被引量: 5发表: 2005年 Crystallographic and Frac...
自己算。d值对应于晶胞参数(不同晶系的对应关系不同)，d值的偏移也就对应于晶胞参数的偏移。